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EDAX Launches New Clarity Direct Electron Detector for EBSD

星期三, 五月 6, 2020

MAHWAH, NJ (May 6, 2020) – EDAX, Inc., a leader in X-ray microanalysis and electron diffraction instrumentation, has launched the world’s first commercially available direct electron detector designed for Electron Backscatter Diffraction (EBSD). The Clarity™ system provides zero noise and zero distortion collection of EBSD patterns by directly measuring the incident electrons onto the detector. This approach removes the traditional phosphor and optics from the collection path, resulting in sharper EBSD patterns with higher sensitivity.

Powered by this technology, Clarity is optimized for applications where traditional EBSD analytical conditions are not viable for quality results. Clarity is ideal for analyzing beam sensitive materials, such as perovskite solar cells, where higher beam currents damage the internal crystallographic structure and inhibit EBSD pattern detection. Lower operating currents also benefit non-conductive samples, such as ceramics, where electron charging effects disrupt analysis. Low-voltage operation reduces the interaction volume within the sample for an improved spatial resolution when working with nanomaterials. The high-quality EBSD patterns collected improve the HR-EBSD and strain analysis.

“The improved pattern quality made possible by the Clarity system raises intriguing possibilities in the area of cross correlation-based EBSD analysis and is already showing promising results in understanding the relationship between complex dislocation structures and internal stress fields in additive manufactured alloys,” said Josh Kacher, an Assistant Professor in the Georgia Tech School of Materials Science and Engineering.

“The Clarity is the next-generation of EBSD detector technology,” said Matt Nowell, EBSD Product Manager for AMETEK EDAX. “This new technology opens doors to research and analysis that was not previously possible. The success of direct electron technology in the electron microscopy world is well-known, and EDAX is excited to bring this approach to EBSD micro- and nano-analysis.”

This new addition to the EDAX portfolio of EBSD detectors offers users a unique option for high-quality EBSD collection and mapping to resolve crystallographic microstructures and solve materials characterization challenges quickly and easily.

For further information, visit www.edax.com or email EDAX at info.edax@ametek.com.

About EDAX
EDAX is an acknowledged leader in Energy Dispersive Microanalysis, Electron Backscatter Diffraction, and X-ray Fluorescence instrumentation. EDAX designs, manufactures, installs, and services high-quality products and systems for leading companies in the semiconductor, metals, geological, pharmaceutical, biomaterials, and ceramics markets.

Since 1962, EDAX has used its knowledge and experience to develop ultra-sensitive silicon radiation sensors, digital electronics, and specialized application software that facilitate solutions to research, development, and industrial requirements.

EDAX is a unit of the Materials Analysis Division of AMETEK, Inc., which is a leading global manufacturer of electronic instruments and electromechanical devices with annual sales of approximately $5 billion. For further information about EDAX, please contact:

Jonathan McMenamin
EDAX, Inc.
91 McKee Drive, Mahwah, NJ 07430
Tel: (201) 529-4880 • Fax: (201) 529-3156
Email: jonathan.mcmenamin@ametek.com Website: www.edax.com